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US 7,582,530 B2Granted
Managing floating gate-to-floating gate spacing to support scalability
AssigneeIntel Corporation
InventorsHenry Chao, Krishna Parat
Life of this patent
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Abstract
Formation techniques are utilized to increase the space or distance between floating gates of a memory array of floating gate transistors. In at least some embodiments, floating gates are first formed over the substrate and then portions of the floating gates are removed to increase the spacing between the floating gates. An interlayer dielectric layer is then formed over the substrate and a control gate layer is formed thereover.
Claims10
A method comprising:
- forming a plurality of floating gates over a substrate, each individual floating gate being separated by a first trench isolation structure and a second isolation trench structure, wherein each individual floating gate has a base having a lateral width that overhangs the first and second trench isolation structure, the base of each individual floating gate being a bottom surface of each individual floating gate substantially parallel to and nearest the substrate;
- and
- removing laterally inward portions of each individual floating gate to provide a plurality of modified individual floating gates, each modified individual floating gate having a pair of sidewalls that taper inwardly away from the first and second trench isolation structure such that the lateral width of the base of each modified individual floating gate is greater than the lateral width of the upper surface of each modified individual floating gate, the upper surface of each individual floating gate being that surface substantially opposite the base, wherein the base of each modified individual floating gate remains overhanging the first and second isolation trench structure, wherein the act of removing comprises thermally oxidizing the individual floating gates to form a layer of thermal oxide thereover each individual floating gate and isotropically etching the thermal oxide layer.
A method comprising:
- forming isolation trenches in a semiconductive substrate;
- forming trench isolation structures within the trenches;
- forming a plurality of polysilicon floating gates over the substrate between the isolation trenches, wherein each individual floating gate has a base and sidewalls, the base being a bottom surface of each individual floating gate substantially parallel to and nearest the substrate, the base of each individual floating gate being formed such that each individual floating gate extends over the isolation trenches;
- removing at least some material of each individual floating gate to form a modified individual floating gate, wherein the act of removing comprises thermally oxidizing the individual floating gates to form a layer of thermal oxide thereover each individual floating gate and isotropically etching the thermal oxide layer;
- forming an interlayer dielectric layer over the floating gates;
- and
- forming a control gate layer over the interlayer dielectric layer.
4 more elements
Dependencies are inferred from the claim text.