Photomask, and method and apparatus for producing the same
AssigneeRenesas Technology Corp.
InventorsYoshikazu Nagamura, Kouji Tange, Kouki Hayashi, Hidehiro Ikeda
Life of this patent
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Abstract
A shading area having a transmissivity in the range of 0 to 2% is formed at the center of a clear defect in a wiring pattern of a half tone mask. Semitransparent areas having a transmissivity in the range of 10 to 25% are formed, adjacently to shading area, in areas extending from the inside of the edge of an imaginary pattern having no defect to the outside of the edge. In this way, in the correction of the defect in the half tone mask, the working accuracy tolerable margin of the correction portion of the defect can be made large.
Claims8
A method for producing the half tone mask comprising:
- a transparent substrate;
- a semitransparent film or shading film provided on the transparent substrate;
- a clear defect portion being a missing portion of a complete pattern that should be formed when it is assumed that the semitransparent film or shading film is completely well formed;
- a shading portion, having a transmissivity of 0 to 2% or 2 to 6%, provided in the clear defect portion;
- and
- a semitransparent portion, formed at the peripheral portion of the shading portion, having a transmissivity larger than that of said shading portion
- wherein
- said shading portion is a first deposition film deposited by FIB radiation,
- said semitransparent portion is a second deposition film deposited by FIB radiation and having a film thickness smaller than that of said first deposition film.
A method for producing the half tone mask comprising:
- a transparent substrate;
- a semitransparent film or shading film provided on the transparent substrate;
- a clear defect portion being a missing portion of a complete pattern that should be formed when it is assumed that the semitransparent film or shading film is completely well formed;
- a shading portion, having a transmissivity of 0 to 2% or 2 to 6%, provided in the clear defect portion;
- and
- a semitransparent portion, formed at the peripheral portion of the shading portion, having a transmissivity larger than that of said shading portion
- wherein
- said semitransparent portion is formed by implanting metal ions into said transparent substrate by FIB radiation.
A method for producing the half tone mask comprising:
- a transparent substrate;
- a semitransparent film or shading film provided on the transparent substrate;
- a clear defect portion being a missing portion of a complete pattern that should be formed when it is assumed that the semitransparent film or shading film is completely well formed:
- a shading portion, having a transmissivity of 0 to 2% or 2 to 6%, provided in the clear defect portion;
- and
- a semitransparent portion, formed at the peripheral portion of the shading portion, having a transmissivity larger than that of said shading portion
- wherein
- said semitransparent portion or shading portion is formed by using FIB radiation to roughen the surface of said transparent substrate.
A method for producing the halftone mask comprising:
- a transparent substrate;
- a semitransparent film or shading film provided on the transparent substrate;
- a clear defect portion being a missing portion of a complete pattern that should be formed when it is assumed that the semitransparent film or shading film is completely well formed;
- a shading portion, having a transmissivity of 0 to 2% or 2 to 6%, provided in the clear defect portion;
- and
- a semitransparent portion, formed at the peripheral portion of the shading portion, having a transmissivity larger than that of said shading portion
- wherein
- said shading portion is a first deposition film deposited by laser CVD, and
- said semitransparent portion is a second deposition film deposited by laser CVD and having a second film thickness smaller than that of said first deposition film.
A defect correcting apparatus for correcting a clear defect in a half tone mask wherein a semitransparent film or first shading film is formed on a transparent substrate, comprising:
- a detector for detecting the location, shape and dimension of a pattern of said semitransparent film or said first shading film;
- comparing means for comparing the pattern detected by the detector with an imaginary pattern that should be formed when it is assumed that a pattern which should be originally formed is completely formed;
- a radiation source for radiating a focused ion beam or laser beam to an area necessary for correcting said clear defect portion generated in said pattern, the area being recognized on the basis of comparative results from the comparing means;
- a gas supplying mechanism for supplying, into said clear defect portion, gas for depositing a second shading film having a transmissivity of almost 0 to 2% or 2 to 6%;
- and
- control means for controlling a location where said focused ion beam or laser beam is radiated onto said half tone mask, wherein
- the control means has therein a program for carrying out a control for radiating said focused ion beam or laser beam onto said transparent substrate in such a manner that after the deposition of said second shading film, a semitransparent portion having a larger transmissivity than said second shading film is formed in the peripheral portion of the second shading film.
Dependencies are inferred from the claim text.