Sanity checker for integrated circuits
AssigneeTaiwan Semiconductor Manufacturing Company, Ltd.
InventorsGeorge H. Chang, Yi-Kan Cheng, Chen-Teng Fan, Chen-Lin Yang, Yung-Chin Hou, Chu-Ping James Wang
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AssigneeTaiwan Semiconductor Manufacturing Company, Ltd.
InventorsGeorge H. Chang, Yi-Kan Cheng, Chen-Teng Fan, Chen-Lin Yang, Yung-Chin Hou, Chu-Ping James Wang
Estimating the term…
This invention discloses a method for sanity checking integrated circuit (IC) designs based on one or more predefined sub-circuits with at least one predefined checking criteria, the method comprising automatically reading one or more netlists, identifying one or more sub-circuits in the netlists isomorphic to at least one of predefined sub-circuits, identifying one or more device parameters for sanity checking the identified sub-circuits, and comparing the identified device parameters against the predefined checking criteria.
A method for sanity checking integrated circuit (IC) designs based on one or more predefined sub-circuits with at least one predefined checking criteria, the method comprising:
A method for sanity checking integrated circuit (IC) designs based on one or more predefined sub-circuits with at least one predefined checking criteria, the method comprising:
A method for sanity checking integrated circuit (IC) designs based on one or more predefined sub-circuits with at least one predefined checking criteria, the method comprising:
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