Apparatus and method for performing a multi-value polling operation in a JTAG data stream
AssigneeTexas Instruments Incorporated
InventorsLee A. Larson, Henry R. Hoar, Huimin Xu
Life of this patent
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AssigneeTexas Instruments Incorporated
InventorsLee A. Larson, Henry R. Hoar, Huimin Xu
Estimating the term…
In a test and debug environment using a JTAG protocol to test a target processing unit, apparatus for multi-value polling permits a poll unit, associated with the scan controller, to determine whether one of several possible signal groups is present in the received data stream. The test and debug unit generates a series of numbers, each number corresponding to a preselected signal groups. The corresponding field in the received data stream is decoded to provide a series of output signals, each output signal corresponding to one group. The output signals of the decoder are compared to corresponding numbers of the expected value. When a signal from the decoder unit is found to correspond to one of the selected data number, the poll operation is a success.
A poll unit for use in polling operations of a test and debug system, the poll unit receiving expected value signals from a test and debug unit, the poll unit responsive to a received data stream from a target processor, the poll unit being included in a scan controller, the poll unit comprising:
A method of providing a polling operation in which a plurality of expected data types are compared to a logic value group in a received data stream in a JTAG protocol scan controller of a test and debug system;
A test and debug system using a JTAG protocol for testing a target processor, the system comprising:
The system as recited in 10, wherein a polling operation initiated by the test and debug unit causes repeat of a previous polling operation without further intervention by the test and debug unit.
Dependencies are inferred from the claim text.