Stress control mechanism for use in high-voltage applications in an integrated circuit

An integrated circuit designed to operate at a supply voltage, comprising:

• voltage pump circuitry that includes an output device having a gate drive level and including a gate oxide having an excessive stress level;
• and
• a gate voltage controller electrically connected to said output device so as to provide said gate drive level, said gate voltage controller configured to vary said gate drive level as a function of said supply voltage;
• wherein said gate voltage controller is configured to generate said gate drive level as a function of a reference current.

An integrated circuit, comprising:

• a voltage pump circuit including an output transistor having a gate input and responsive to a gate drive level;
• a voltage pump control circuit electrically connected to said gate input of said output transistor and configured to output said gate drive level in response to a reference current;
• a reference current generator electrically connected to said voltage pump control circuit so as to provide said voltage pump control circuit with said reference current;
• said reference current generator configured to generate said reference current as a function of a first reference voltage and a second reference voltage;
• a first reference voltage generator electrically connected to said reference current generator for providing said first reference voltage to said reference current generator;
• and
• a second reference voltage generator electrically connected to said reference current generator for providing said second reference voltage to said current generator.