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US 7,461,464 B2Granted
Position measuring arrangement
AssigneeJohannes Heidenhain GmbH
InventorsRudolf Mittmann, Erich Strasser
Life of this patent
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AssigneeJohannes Heidenhain GmbH
InventorsRudolf Mittmann, Erich Strasser
Estimating the term…
A position measuring arrangement that includes an arrangement of scanning elements for scanning an absolute code and a selection system for selecting scanning signals from the arrangement of scanning elements by a first method of selection and a second method of selection different from the first method of selection. The position measuring arrangement further includes a decoding device for forming a first absolute measured position value from the scanning signals selected by the selection system when the first method of selection is applied to the selection system and a second absolute measured position value from the scanning signals selected by the selection system when the second method of selection is applied.
A position measuring arrangement, comprising:
A method for operating an absolute position measuring arrangement, the method comprising:
Dependencies are inferred from the claim text.