Surface information measuring apparatus and surface information measuring method
AssigneeSII NanoTechnology Inc.
InventorHiroyoshi Yamamoto
Life of this patent
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AssigneeSII NanoTechnology Inc.
InventorHiroyoshi Yamamoto
Estimating the term…
To measure surface information and physical information of a sample with high accuracy by promoting linearity in Z direction by nullifying cross talk in XY directions as less as possible, there is provided a surface information measuring apparatus including a probe having a stylus, a Z actuator fixed with the probe for being elongated and contracted in Z direction orthogonal to a sample surface B when applied with a voltage, an applicator for applying the voltage to the Z actuator, and a controller for controlling to operate the applicator, in which the Z actuator includes a piezoelectric member capable of being elongated and contracted in Z direction and a plurality of divided electrodes provided to be respectively electrically independent from each other in a state of being divided by at least 3 or more in a peripheral direction at an inner peripheral face or an outer peripheral face of the piezoelectric member for applying voltages to elongate and contract the piezoelectric member within ranges of contact regions, and the controller controls the applicator to apply voltages by a previously determined rates of voltage applying amounts such that elongating or contracting amounts of respective contact regions of the piezoelectric member respectively brought into contact with the divided electrodes respectively become the same.
A surface information measuring apparatus which is a surface information measuring apparatus for measuring shape information of a sample surface or physical information of a sample by making a stylus proximate to or brought into contact with the sample surface, said surface information measuring apparatus comprising:
A surface information measuring method which is a surface information measuring method of measuring shape information of a sample surface or physical information of a sample in a state of applying a voltage to elongate or contract in a Z direction a Z actuator including a piezoelectric member having a section in a cylindrical shape, formed to elongate in the Z direction orthogonal to the sample surface and capable of being elongated or contracted in the Z direction, and a plurality of divided electrodes provided to be respectively electrically independent from each other in a state of being divided at least by three or more in a peripheral direction at an inner peripheral face or an outer peripheral face of the piezoelectric member for applying the voltage to the piezoelectric member to elongate or contract in the Z direction within ranges of regions brought into contact therewith and fixed with a stylus arranged on an upper side of the sample at a front end thereof and making the stylus proximate to or brought into contact with the sample surface, said surface information measuring method comprising:
Dependencies are inferred from the claim text.