Method, system, and program product for controlling test data of a logic built-in self-test of an integrated circuit

A system for controlling test data with a boundary latch module having a plurality of latches to facilitate testing an external signal path of an integrated circuit concurrently with logic built-in self testing of the integrated circuit, the system comprising:

• (i) a plurality of selection devices coupled to a plurality latches of a boundary latch module, the plurality of selection devices for selecting initialization data to store in the plurality of latches of the boundary latch module of the integrated circuit;
• (ii) means for utilizing the plurality of selection devices to select the initialization data from a plurality of scan paths of the integrated circuit;
• (iii) means for providing the initialization data from at least one of the plurality of latches as at least one output of the integrated circuit for testing at least one external signal path of the integrated circuit;
• (iv) another selection device in the another boundary latch module, the another selection device for selecting an external datum provided by an external input to the integrated circuit or a test-pattern datum from test-pattern generator logic of the integrated circuit;
• (v) means for utilizing the another selection device to select the external datum or the test-pattern datum as a datum for capture in at least one of the plurality of latches of the another boundary latch module;
• and
• (vi) means for providing the datum captured by the at least one of the plurality of latches of the another boundary latch module as at least one input to a multiple-input signature register, the multiple-input signature register storing a signature of the integrated circuit resulting from the logic built-in self-testing.

At least one program storage device readable by a machine embodying at least one program of instructions executable by the machine to perform a method of controlling test data with a boundary latch module having a plurality of latches to facilitate testing an external signal path of an integrated circuit concurrently with logic built-in self testing of the integrated circuit, the method comprising:

• (i) providing a plurality of selection devices coupled to a plurality latches of a boundary latch module, the plurality of selection devices for selecting initialization data to store in the plurality of latches of the boundary latch module of the integrated circuit;
• (ii) utilizing the plurality of selection devices to select the initialization data from a plurality of scan paths of the integrated circuit;
• (iii) providing the initialization data from at least one of the plurality of latches as at least one output of the integrated circuit for testing at least one external signal path of the integrated circuit;
• (iv) providing another selection device in the another boundary latch module, the another selection device for selecting an external datum provided by an external input to the integrated circuit or a test-pattern datum from test-pattern generator logic of the integrated circuit;
• (v) utilizing the another selection device to select the external datum or the test-pattern datum as a datum for capture in at least one of the plurality of latches of the another boundary latch module;
• and
• (vi) providing the datum captured by the at least one of the plurality of latches of the another boundary latch module as at least one input to a multiple-input signature register, the multiple-input signature register storing a signature of the integrated circuit resulting from the logic built-in self-testing.