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US 7,412,342 B2Granted
Low cost test for IC's or electrical modules using standard reconfigurable logic devices
AssigneeIntel Corporation
InventorsStephen S. Sturges, Brad Inman, Robert C. Hash
Life of this patent
Estimating the term…
Abstract
Low cost test for Integrated Circuits or electrical modules using a reconfigurable logic device is described. In one embodiment, the invention includes configuring a reconfigurable logic device to comply with input standards of a device under test, applying test signals to the device under test, detecting output results of the device under test, and analyzing the detected output results.
Claims27
A method comprising
- configuring a reconfigurable logic device to comply with input standards of a device under test;
- setting an electrical configuration of an I/O pin of the logic device, the I/O pin being directly coupled to a pin of the device under test;
- applying test signals to the device under test through the I/O pin;
- detecting output results of the device under test at a signal detector, the signal detector being coupled to the reconfigurable logic device for two-way communication to receive control signals from the logic device;
- and
- analyzing the detected output results by measuring the voltage of the detected output results at the signal detector and sending the voltage measurements from the signal detector to the logic device.
3 more elements
An article comprising a machine readable medium including data that when accessed by a machine causes the machine to perform operations comprising:
- configuring a reconfigurable logic device to comply with input standards of a device under test;
- setting an electrical configuration of an I/O pin of the logic device, the I/O pin being directly coupled to a pin of the device under test;
- applying test signals to the device under test through the I/O pin;
- and
- receiving voltage measurements from a signal detector coupled to the reconfigurable logic device for two-way communication, the signal detector receiving control signals from the logic device, receiving output results from the device under test through the I/O pin, measuring the voltage thereof, and sending the voltage measurements from the signal detector to the logic device.
2 more elements
An apparatus comprising:
- a reconfigurable logic device to generate test signals to be applied from pins of the reconfigurable logic device to pins of a device under test, the logic device being directly coupled to the device under test;
- and
- a signal detector to detect signals from the pins of the device under test, to generate a voltage measurement of the detected signals, and to send the voltage measurement to the logic device, the logic device being coupled to the signal detector for two-way communications, wherein the logic device sends control signals to the signal detector and receives voltage measurements from the signal detector.
An apparatus comprising:
- a reconfigurable logic device to generate test signals to be applied from pins of the reconfigurable logic device to pins of a device under test;
- a socket to carry the device under test, the socket having connectors coupled to the pins of the device under test to carry signals to and from the pins, so that the logic device is directly coupled to a device under test, when the device under test is in the socket;
- a signal detector to detect signals from the connectors of the socket, and to generate a voltage measurement of the detected signals, the signal detector also being coupled to the reconfigurable logic device for two-way communications to send the voltage measurement to the logic device and to receive control signals from the logic device;
- and
- a circuit board to couple pins of the reconfigurable logic device to connectors of the socket.
2 more elements
An apparatus comprising:
- a reconfigurable logic device to generate test signals to be applied from pins of the reconfigurable logic device to pins of a device under test;
- a socket to carry the device under test, the socket having connectors coupled to the pins of the device under test to carry signals to and from the pins, so that the logic device is directly coupled to a device under test, when the device under test is in the socket;
- a signal detector coupled to the reconfigurable logic device to detect signals from the connectors of the socket, and to generate a voltage measurement of the detected signals, the signal detector also being coupled to the reconfigurable logic device for two-way communications to and to send the voltage measurement to the logic device and to receive control signals from the logic device;
- a circuit board to couple pins of the reconfigurable logic device to connectors of the socket;
- a power supply to supply power to a device under test carried by the socket;
- and
- an external interface on the circuit board to receive control signals to control the power supply.
4 more elements
Dependencies are inferred from the claim text.