Method for the evaluation of a first analog signal and a second analog signal, and evaluation circuit corresponding therewith
AssigneeSiemens Aktiengesellschaft
InventorHans-Georg Köpken
Life of this patent
Estimating the term…
Loading patent…
AssigneeSiemens Aktiengesellschaft
InventorHans-Georg Köpken
Estimating the term…
Two analog signals are substantially sinusoidal and out-of-phase by about 9020 relative to each other when an element moves in a temporally uniform manner in relation to a stationary element. The two analog signals make it possible to determine the actual position of the moving element relative to the stationary element. The analog signals have a corresponding maximum frequency when the moving element moves at a maximum speed. The signals are detected by sensor units and are fed to AD converters which digitize the signals at a scanning frequency and feed corresponding digital signals to an evaluation block that is configured as a hardware circuit, the scanning frequency of the AD converters being more than twice as large as the maximum frequency. The digital signals are fed to a computing block within the evaluation block, said computing block calculating an arc tangent that corresponds to the digital signals in real time. The evaluation block also determines corrective values for the digital signals in real time based on the digital signals.
A method for an evaluation of a first analog signal and a second analog signal, comprising:
An evaluation circuit for a first analog signal and a second analog signal, comprising:
Dependencies are inferred from the claim text.