Plasma detector and laser beam machine with plasma detector
AssigneeYamazaki Mazak Corporation
InventorsTsunehiko Yamazaki, Naoomi Miyagawa
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AssigneeYamazaki Mazak Corporation
InventorsTsunehiko Yamazaki, Naoomi Miyagawa
Estimating the term…
Voltage fluctuating time integrating means integrates voltage fluctuating time when voltage of a sensor electrode fluctuates as a voltage fluctuation integrated time, and voltage fluctuation occurrence rate computing means computes a rate of occurrence of voltage fluctuation for time on the basis of the voltage fluctuation integrated time integrated. By doing so, quantity of generated plasma can be taken as the rate of occurrence of voltage fluctuation, and plasma detection judging means can easily detect large volume of generated plasma on the basis of the computed voltage fluctuation occurrence rate. Then, it is not necessary to provide a circuit for measuring electric resistance between the sensor electrode and a workpiece as a conventional way, thereby avoiding complexly structured plasma detector.
A plasma detector of a laser beam machine, said laser beam machine having a torch for radiating a laser beam on a workpiece, said plasma detector for detecting whether or not plasma generates between said torch and said workpiece, said plasma detector comprising:
A laser beam machine comprising:
A plasma detector of a laser beam machine, said laser beam machine having a torch for radiating laser beam on a workpiece, a trace control unit for holding a gap length between said torch and a workpiece, said plasma detector for detecting whether or not plasma generates between said torch and said workpiece, said trace control unit having:
A laser beam machine comprising:
Dependencies are inferred from the claim text.