Method of manufacturing a semiconductor device
AssigneeRenesas Technology Corp.
InventorsSyuudai Fukaya, Toshiyuki Shinya, Hajime Hasebe
Life of this patent
Estimating the term…
Loading patent…
AssigneeRenesas Technology Corp.
InventorsSyuudai Fukaya, Toshiyuki Shinya, Hajime Hasebe
Estimating the term…
A semiconductor device improved in packaging reliability is disclosed. Each of leads used in the semiconductor device has a first surface positioned between a main surface of a resin sealing body and a back surface opposite to the main surface of the resin sealing body, a second surface positioned on the side opposite to the first surface and exposed from the back surface of the resin sealing body, a first end face positioned on a semiconductor chip side, a second end face positioned on the side opposite to the first end face and exposed from a side face of the resin sealing body, and a recessed portion depressed from the second surface to the first surface side and contiguous to the second end face, the second surface and an inner wall surface of the recessed portion being covered with a plating layer which is higher in solder wettability than the second end face of each of the leads.
A method of manufacturing a semiconductor device, comprising the steps of:
A method of manufacturing a semiconductor device, comprising the steps of:
A method of manufacturing a semiconductor device, comprising the steps of:
A method of manufacturing a semiconductor device, comprising the steps of:
Dependencies are inferred from the claim text.