Low resistance contact structure and fabrication thereof
AssigneeInternational Business Machines Corporation
InventorsKeith Kwong Hon Wong, Patrick W. DeHaven, Sadanand V. Deshpande, Anita Madan
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AssigneeInternational Business Machines Corporation
InventorsKeith Kwong Hon Wong, Patrick W. DeHaven, Sadanand V. Deshpande, Anita Madan
Estimating the term…
Embodiments of the present invention provide a method of fabricating a contact structure in a layer of dielectric material between a semiconductor device and a back-end-of-line interconnect. The method includes creating at least one contact opening in said layer of dielectric material; forming a first TiN film through a chemical-vapor deposition process, said first TiN film lining said contact opening; and forming a second TiN film through a physical vapor deposition process, said second TiN film lining said first TiN film. A contact structure fabricated according to embodiments of the invention is also provided.
A method of fabricating a contact structure in a layer of dielectric material between a semiconductor device and a back-end-of-line interconnect, the method comprising:
A method of fabricating a semiconductor structure, the method comprising:
A method of creating a structure, comprising:
Dependencies are inferred from the claim text.