Droplet discharge inspection apparatus and method
AssigneeSeiko Epson Corporation
InventorToshimasa Mori
Life of this patent
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AssigneeSeiko Epson Corporation
InventorToshimasa Mori
Estimating the term…
An inspection apparatus includes an inspection body that has a non-conductive substrate, a droplet receiving portion for receiving a droplet that is provided on the substrate, and a plurality of electrodes that are exposed on an inner surface portion of the droplet receiving portion. The droplet receiving portion has a size that corresponds to a droplet size in a state when a discharged droplet impacts normally. The inspection apparatus also includes a detector that is connected to the electrodes of the inspection body and detects a conductivity in the droplet receiving portion. The inspection apparatus makes it possible to inspect easily and in a short time period the discharge performance of a droplet discharge head of a droplet discharge apparatus. A droplet discharge inspection method is also provided.
An inspection apparatus for inspecting a discharge performance of a droplet discharge head that discharges droplets, the inspection apparatus comprising:
A droplet discharge inspection method for inspecting a discharge performance of a droplet discharge head, the droplet discharge inspection method comprising the steps of:
Dependencies are inferred from the claim text.