Adaptable end effector for atomic force microscopy based nano robotic manipulators

Abstract

An improved nanomanipulation system is provided for performing nanomanipulation operations in relation to a sample surface. The system includes: an atomic force microscope having a probe for performing nanomanipulation operations on the sample surface, where the probe includes a cantilever having a layer of piezoelectric material; a position detector configured to ascertain deformation of the cantilever during a nanomanipulation operation; and an adaptable end effector controller adapted to receive data indicative of the deformation from the position detector and implements a control scheme based on the deformation data. The control scheme produces a control signal that is applied to the piezoelectric material of the cantilever, thereby maintaining the straight shape of the cantilever during the nanomanipulation operation.

Dependencies are inferred from the claim text.