Lithographic apparatus, projection apparatus and device manufacturing method
AssigneeASML Netherlands B.V.
InventorsHans Butler, Evert Hendrik Jan Draaijer, Marcus Joseph Elisabeth Godfried Breukers
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AssigneeASML Netherlands B.V.
InventorsHans Butler, Evert Hendrik Jan Draaijer, Marcus Joseph Elisabeth Godfried Breukers
Estimating the term…
A control system to control a position of a substrate table for a lithographic apparatus, including: a first detection device to generate a position signal representative of the position of the projection system, a second detection device to generate a projection system feed-forward signal, a comparative unit to generate a servo error signal by subtracting a signal representative of an actual substrate table position from a substrate table position reference signal and adding the projection system position signal, a control unit to generate a first control signal on the basis of the servo error signal, an addition unit to generate a second control signal by adding the feed-forward signal and the first control signal, and an actuator unit to actuate the substrate table to a desired substrate table position on the basis of the second control signal. The control system further includes a projection system position signal filter unit.
A lithographic apparatus comprising:
A lithographic apparatus comprising:
A projection apparatus comprising a control system configured to control a position of a first component, on the basis of a first component reference signal and a position of a second component, said control system comprising:
A device manufacturing method comprising using a projection system for projecting a patterned beam of radiation onto a substrate, said substrate being supported on a substrate table, wherein a control system configured to control the position of said substrate table is used,
A device manufacturing method comprising using a projection system for projecting a patterned beam of radiation, said pattern being imparted by a patterning device, said patterning device being supported on a patterning device support,
A device manufacturing method comprising using a projection apparatus:
Dependencies are inferred from the claim text.