Lithographic apparatus and device manufacturing method
AssigneeASML Netherlands B.V.
InventorsBernardus Antonius Johannes Luttikhuis, Harmen Klaas Van Der Schoot, Petrus Matthijs Henricus Vosters
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AssigneeASML Netherlands B.V.
InventorsBernardus Antonius Johannes Luttikhuis, Harmen Klaas Van Der Schoot, Petrus Matthijs Henricus Vosters
Estimating the term…
A lithographic method and apparatus comprises an illumination system that supplies a beam of radiation, a patterning device that patterns the beam, and a projection system that projects the patterned beam onto a target portion of a substrate. A metrology system is provided adjacent the projection system for aligning the substrate with the projection system. Two or more movable chucks are each arranged to support a substrate and move between a loading device and the projection system. The chucks are independently movable so that one substrate can be passed through the metrology system and patterned beam while the other substrates are moved between the loading system and projection system.
A lithographic apparatus, comprising:
A carousel for use in a lithographic apparatus that comprises an illumination, patterning, and projection system that patterns a beam of radiation and projects the patterned beam onto a target portion of a substrate and a metrology system adjacent the projection system that ensures the substrate is aligned with the projection system, the carousel comprising:
A device manufacturing method, comprising:
Dependencies are inferred from the claim text.