Ion sampling system for wafer

A wafer surface ion sampling system, comprising:

• a sampling chamber, comprised an upper part and a lower part, wherein the upper part accommodates a wafer, and the lower part has a funnel shape and comprises an extract solution collection opening;
• a plurality of wafer carrier beams for holding the wafer, arranged around an upper part of a sidewall of the sampling chamber dispersedly, wherein each wafer carrier beam comprises a first wafer anchoring pin disposed on a peripheral surface of the wafer carrier beam, wherein the wafer anchoring pin extends in a first direction different from the direction which the wafer carrier beam extends, and each of the wafer carrier beams extends from the upper sidewall to the inside of the sampling chamber and passes the upper sidewall of the sampling chamber to the outside of the sampling chamber;
• an extraction liquid spraying apparatus, disposed at a top part of the sampling chamber to spray an extraction liquid on a surface of the wafer;
• and
• an extraction liquid supply apparatus, connected to the extraction liquid spraying apparatus to provide the extraction liquid to the extraction liquid spraying apparatus.