Semiconductor apparatus and method of manufacturing same, and method of detecting defects in semiconductor apparatus

A semiconductor apparatus comprising:

• a semiconductor substrate having a device region and a periphery region surrounding the device region;
• a semiconductor device provided in the device region of the semiconductor substrate;
• a first electrode pad provided on the semiconductor substrate;
• a second electrode pad provided on the semiconductor substrate;
• a third electrode pad provided on the semiconductor substrate;
• a strip-like, first conductivity type semiconductor pattern extending in the periphery region of the semiconductor substrate and electrically connected to the first electrode pad;
• a strip-like, second conductivity type semiconductor pattern provided on the first conductivity type semiconductor pattern and constituting a p-n junction in conjunction with the first conductivity type semiconductor pattern, the second electrode pad being electrically connected to one end of the second conductivity type semiconductor pattern;
• and
• a first conductivity type semiconductor layer electrically connected to the third electrode pad and provided on the other end of the second conductivity type semiconductor pattern to constitute at least in part a p-n junction, thereby constituting a transistor in conjunction with the first and second conductivity type semiconductor patterns.