Characterizing degradation of components during reliability-evaluation studies
AssigneeSun Microsystem, Inc.
InventorsDan Vacar, David K. McElfresh, Kenny C. Gross, Leoncio D. Lopez
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AssigneeSun Microsystem, Inc.
InventorsDan Vacar, David K. McElfresh, Kenny C. Gross, Leoncio D. Lopez
Estimating the term…
A system that characterizes degradation of a component in a system. During operation, the system monitors inferential variables associated with a specimen of the component. Next, the system determines a time for the onset of degradation for the specimen and determines a time for the completion of degradation for the specimen. The system then computes a time interval between the onset of degradation and the completion of degradation, and uses the time interval to look up an entry in a defect library to obtain information which characterizes the degradation of the specimen of the component.
A method for characterizing degradation of a component in a system, comprising:
A computer-readable storage medium storing instructions that when executed by a computer cause the computer to perform a method for characterizing degradation of a component in a system, wherein the method comprises:
An apparatus that characterizes degradation of a component in a system, comprising:
Dependencies are inferred from the claim text.