US 7,204,122 B2Granted

Systems and methods for calibrating osmolarity measuring devices

AssigneeOcusense, Inc.

InventorsBenjamin Sullivan, Eric Donsky

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Abstract

An osmolarity measuring system comprising microscale electrode arrays is configured to account for variations and defects in the arrays using a tiered approach comprising several calibration methods. One method accounts for the intrinsic conductivity of the electrodes and subtracts out the intrinsic conductivity on a pair-wise basis, when determining osmolarity of a sample fluid. Other methods in the tiered approach use standards to determine calibration factors for the electrodes that can then be used to adjust subsequent osmolarity measurements for a sample fluid. The use of a standard can also be combined with a washing step.

Claims19

Dependent claims

An osmolarity measuring system, comprising:

a sample receiving chip, the sample receiving chip comprising a sample region that includes a plurality of electrodes, the sample region configured to receive an aliquot of fluid and a certain amount of a standard test fluid;
and
a processing device coupled with the sample receiving chip, the processing device configured to determine a pair-wise calibration factor for the plurality of electrodes based on signals applied to and received from the plurality of electrodes when the standard test fluid is applied to the sample region, determine electrical properties for the aliquot of fluid based on signals applied to and received from the plurality of electrodes when the aliquot of fluid is applied to the sample region, and to calibrate the determined electrical properties using the pair wise calibration factor determined for the plurality of electrodes.

Dependencies are inferred from the claim text.

Facts

Application: 11/327,884Filed 9 Jan 2006 · division
Priority: 6 Aug 2002
Published: US 2006/0107729 A125 May 2006
Granted: 17 Apr 2007
Term ends: Not estimatedThe source records don’t support an estimate.

Classification2 codes

G01N 13/04
Investigating surface or boundary effects, e.g. wetting power; Investigating diffusion effects; Analysing materials by determining surface,…:…
G01N
Investigating or analysing materials by determining their chemical or physical properties

Family

Application60/401,432Us provisional application · filed 6 Aug 2002
Application10/400,617Parent of this continuation-in-part · filed 25 Mar 2003
Application10/772,084Parent of this division · filed 3 Feb 2004
US 2006/0107729 A1Pre-grant publication · published 25 May 2006
US 7,051,569 B2Parent of this division
US 7,017,394 B2Parent of this continuation-in-part
Application10/772,084Parent of this continuation-in-part
US 2004/0036485 A1Published application
US 2005/0120772 A1Published application
US 7,204,122 B2This patent

From the US filing history. Foreign family members aren’t listed.

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