Probe mounting device for a scanning probe microscope
AssigneeJPK Instruments AG
InventorsOlaf Sünwoldt, Heiko Haschke
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Abstract
The invention relates to a probe (207) mounting device for a scanning probe microscope, especially a scanning force microscope, comprising a retaining member (200) for installation in a measuring assembly of a scanning probe microscope. The probe (207) is detachably mounted on the retaining member (200) by means of a clamping member (201), the clamping member being secured in self-locking fashion to the retaining member (200).
Claims16
A probe mounting device for a scanning probe microscope, especially a scanning force microscope, comprising a retaining member for installation in a measuring assembly of a scanning probe microscope, characterized in that a probe is detachably mounted on the retaining member by means of a clamping member, the clamping member being secured in self-locking fashion to the retaining member.
The device as claimed in clam 1, wherein the clamping member is mounted in an area of the retaining member which area is separated from another area of the clamping member by a fluid-tight seal.
Dependencies are inferred from the claim text.