System for simultaneous projections of multiple phase-shifted patterns for the three-dimensional inspection of an object

A three-dimensional image grabber, comprising:

• a means for simultaneously projecting at least two phase-shifted patterns onto the object;
• each of said projected patterns being produced by decomposition of one of:
• a white light;
• and a non-white light including a plurality of monochromatic lights;
• into one of:
• a plurality of monochromatic lights, and:
• non overlapping bandwidths;
• and
• a means for simultaneously taking an image of each of said projected patterns on the object;
• said image taking means being sensitive to one of:
• said plurality of monochromatic lights and:
• said non overlapping bandwidths.

A system for measuring the relief of an object, said system comprising:

• a pattern projecting assembly for simultaneously projecting at least three phase-shifted patterns onto the object;
• each of said projected patterns being characterized by a predetermined bandwidth;
• an image acquisition apparatus sensitive to said predetermined bandwidths for taking an image of each of said at least three phase-shifted projected patterns on the object;
• each of said images including a plurality of pixels having intensity values;
• and
• a controller configured for:
• a) receiving from the image acquisition apparatus said at least three images of the projected patterns onto the object;
• b) computing the object phase for each pixel using the at least three object intensity values for the corresponding pixel;
• and
• c) computing the relief of the object at each pixel position using said object phase at the corresponding pixel position;
• wherein said pattern projecting assembly includes a grid illuminated by an illuminating assembly, a spectral splitter to be positioned between said grid and said illuminating assembly and a projector for projecting said illuminated grid onto said object;
• said illuminating assembly including a source of white light so positioned as to be projected through said grid.

A system for measuring the relief of an object, said system comprising:

• a pattern projecting assembly for simultaneously projecting at least three phase-shifted patterns onto the object;
• each of said projected patterns being characterized by a predetermined bandwidth;
• an image acquisition apparatus sensitive to said predetermined bandwidths for taking an image of each of said at least three phase-shifted projected patterns on the object;
• each of said images including a plurality of pixels having intensity values;
• and
• a controller configured for:
• a) receiving from the image acquisition apparatus said at least three images of the projected patterns onto the object;
• b) computing the object phase for each pixel using the at least three object intensity values for the corresponding pixel;
• and
• c) computing the relief of the object at each pixel position using said object phase at the corresponding pixel position;
• wherein said pattern projection assembly includes at least two pattern apparatuses and a reflecting arrangement;
• each of said pattern projecting apparatus being configured to project a light having a predetermined bandwidth through a pattern;
• said reflecting arrangement being so configured as to direct said projected patterns along a common direction of incidence.