Microscope and microscopy method for producing overlay images
AssigneeLeica Microsystems CMS GmbH
InventorsAlbrecht Weiss, Michael Ganser
Life of this patent
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Abstract
A microscope includes an interference contrast transmitted-light device having an analyzer disposed in the microscope imaging beam path, the analyzer causing a beam deflection. A fluorescence device is provided, the fluorescence device and the interference contrast transmitted-light device being selectably and alternatively insertable into the imaging beam path. A pair of glass wedge plates are arranged behind the analyzer in the imaging direction so as to compensate to zero for the beam deflection caused by the analyzer.
Claims11
A microscope comprising:
- an interference contrast transmitted-light device including an analyzer, the analyzer being disposed in an imaging beam path of the microscope and causing a beam deflection;
- a fluorescence device, the fluorescence device and the interference contrast transmitted-light device being selectably and alternatively insertable into the imaging beam path;
- and
- a first glass wedge plate and a second glass wedge plate disposed behind the analyzer in an imaging direction so as to compensate to zero for the beam deflection caused by the analyzer.
A method for providing overlay images, the method comprising the steps of:
- providing a first microscope image using an interference contrast transmitted-light device and acquiring the first microscope image using a camera, the interference contrast transmitted-light device including an analyzer;
- providing a second microscope image using a fluorescence device and acquiring the second microscope image using the camera;
- superimposing the first microscope image and the second microscope image so as to provide an overlay image;
- and
- disposing a first glass wedge plate and a second glass wedge plate in the interference contrast transmitted-light device behind the analyzer in an imaging direction so that a total beam deflection of the glass wedge plates compensates to zero for a beam deflection caused by the analyzer so as to compensate to zero for an image offset of the first microscope image relative to the second microscope image due to the beam deflection.
Dependencies are inferred from the claim text.