Method of manufacturing a semiconductor device by providing a mirror in the attenuation region
AssigneeSemiconductor Energy Laboratory Co., Ltd.
InventorsKoichiro Tanaka, Tomoaki Moriwaka
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AssigneeSemiconductor Energy Laboratory Co., Ltd.
InventorsKoichiro Tanaka, Tomoaki Moriwaka
Estimating the term…
Attenuation regions of laser light are removed or reduced in size using a slit located in the immediate vicinity of a surface to be irradiated so that a steep energy distribution is obtained in the end portions of the laser light. The reason why the slit is located in the immediate vicinity of the surface to be irradiated is to suppress the spread of the laser light. In addition, the attenuation regions of the laser light are folded by using a mirror instead of the slit to increase energy densities in the attenuation regions by one another so that a steep energy density distribution is obtained in the end portions of the laser light.
A method of manufacturing a semiconductor device comprising:
A method of manufacturing a semiconductor device comprising:
A method of manufacturing a semiconductor device comprising:
A method of manufacturing a semiconductor device comprising:
Dependencies are inferred from the claim text.