Device used to produce or examine semiconductors
AssigneeIbiden Co., Ltd.
InventorsYasuji Hiramatsu, Yasutaka Ito
Life of this patent
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Abstract
A semiconductor-producing/examining device that can maintain a preferable connection state for a predetermined period of time and that can easily remove a ceramic substrate from a supporting case. The semiconductor producing/examining device includes a ceramic substrate having a conductor layer formed on the surface thereof or inside thereof and a supporting case. An external terminal is connected to the conductor layer. A connection between the conductor layer and the external terminal is performed such that the external terminal is pressed on the conductor layer or the external terminal is pressed on another conductor layer connected to the conductor layer by using the elastic force and the like of an elastic body.
Claims10
A device used to produce or examine semiconductors comprising:
- a ceramic substrate having a resistance heating element formed on the surface thereof;
- and
- a supporting case, wherein
- an external terminal is connected to said resistance heating element, and
- said external terminal is pressed on said resistance heating element, or said external terminal is pressed on a conductor layer connected to said resistance heating element.
A device used to produce or examine semiconductors, comprising:
- a ceramic substrate having a resistance heating element formed inside thereof;
- a supporting case;
- and
- an external terminal connected to said resistance heating element, wherein
- said external terminal is pressed on said resistance heating element, or said external terminal is pressed on a conductor layer connected to said resistance heating element.
Dependencies are inferred from the claim text.