Heat treatment apparatus of light-emission type and method of cleaning same
AssigneeDainippon Screen Mfg. Co., Ltd.
InventorYoshihide Nozaki
Life of this patent
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AssigneeDainippon Screen Mfg. Co., Ltd.
InventorYoshihide Nozaki
Estimating the term…
After the maintenance of a heat treatment apparatus, a susceptor and a heating plate are moved upwardly and a nitrogen gas flow from an inlet toward an outlet passage is produced prior to heat treating a semiconductor wafer. In this state, flash lamps are turned on to cause momentary expansion and contraction of the gas in a chamber, thereby scattering particles deposited on a bottom plate, etc. The scattered particles are removed by the nitrogen gas passing through a bottom portion of the chamber and discharged through the outlet passage. The particles are easily removed due to the flash lamps being turned on a predetermined number of times at fixed time intervals while folowing the nitrogen gas. The heat treatment apparatus has a light-emission characteristic and easily removes the particles in the chamber.
A heat treatment apparatus for exposing a substrate to a flash of light to heat the substrate, comprising:
A heat treatment apparatus for exposing a substrate to flash of light to heat the substrate, comprising:
A method of cleaning a heat treatment apparatus, said heat treatment apparatus exposing a substrate received in a process chamber to a flash of light to heat the substrate, said method comprising the steps of:
A method of cleaning a heat treatment apparatus, said heat treatment apparatus exposing a substrate received in a process chamber to a flash of light to heat the substrate, said method comprising the steps of:
Dependencies are inferred from the claim text.