Exposure apparatus and stage device, and device manufacturing method
AssigneeNikon Corporation
InventorsKenji Nishi, Masahiko Okumura, Hiroki Okuno
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AssigneeNikon Corporation
InventorsKenji Nishi, Masahiko Okumura, Hiroki Okuno
Estimating the term…
After exposure of a divided area on a wafer is completed, for exposure of the next divided area, a control unit sends configuration information on control parameters necessary to expose the next divided area to a stage control system, sometime before the stage control system begins deceleration of a reticle stage and a wafer stage in a scanning direction. Therefore, both stages do not have to be suspended before acceleration for the stage control system to receive the configuration information on control parameters necessary to expose the next divided area, and since suspension time is not required, throughput can be improved. In this case, no serious problems occur, so the performance of other devices is not disturbed.
An exposure apparatus that sequentially transfers a pattern of a mask onto a plurality of divided areas on an object by synchronously moving said mask and said object in a predetermined scanning direction, said exposure apparatus comprising:
An exposure apparatus that sequentially transfers a pattern of a mask onto a plurality of divided areas on an object by synchronously moving said mask and said object in a predetermined scanning direction, said exposure apparatus comprising:
Dependencies are inferred from the claim text.