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US 7,038,472 B1Granted
Methods and systems for measuring internal dimensions of microscale structures
AssigneeCaliper Life Sciences, Inc.
InventorRing-Ling Chien
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Abstract
The present invention provides novel devices for measuring internal dimensions of microscale structures. Methods in accordance with the invention use the voltage measured at a midpoint between a reference structure and a sample structure to determine the resistance of the sample structure, and to then calculate an internal dimension of the sample structure.
Claims11
A method of measuring an internal dimension of a sample structure comprising:
- providing a reference structure having a known internal dimension and a known length;
- serially connecting a sample structure having an unknown internal dimension and known length to said reference structure;
- flowing a fluid through said reference structure and said sample structure, the fluid flowing through the reference and sample structure forming a first conductive path;
- measuring a first voltage difference across the first conductive path;
- measuring a second voltage difference across a portion of the first conductive path spanning the length of the sample structure;
- and
- determining the internal dimension of said sample structure from the first voltage difference and the second voltage difference.
4 more elements
Dependencies are inferred from the claim text.