Real-time detection mechanism with self-calibrated steps for the hardware baseline to detect the malfunction of liquid vaporization system in AMAT TEOS-based Dxz chamber

A method of self-calibrating a thin film vaporization system and depositing thin film on a substrate placed in a deposition chamber comprising the steps of:

• providing a carrier gas and a thin film vaporization system comprising stored liquid precursors in tanks under pressure connected to a deposition chamber via a manifold which in turn is connected to pipe lines emanating from each tank and coupled to own liquid flow meters (LFMs) and injection valves (IVs), wherein the carrier gas has its own pipe line connected to said manifold;
• then
• activating a servo mechanism to pump down said deposition chamber having disposed in it a substrate to be deposited thin film;
• then
• allowing said carrier gas to flow into said deposition chamber via said manifold;
• then
• measuring first pressure levelin said deposition chamber to establish a baseline calibration for said vaporization system;
• then
• using a vaporization process to vaporize said liquid precursor and allowing said liquid precursor to flow into said deposition chamber via said manifold;
• then
• measuring second pressure level in said deposition chamber to establish an upperline calibration for said vaporization system using no further pressure measurements;
• then
• performing thin film deposition in said deposition chamber using results of said upperline calibration, and monitoring said second pressure level in said deposition chamber during said performing thin film deposition thereby monitoring real-time change in, and detecting malfunctions of, said vaporization process.