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US 7,024,565 B1Granted
Method and apparatus to detect circuit tampering
AssigneeIntel Corporation
InventorsMark A. Beiley, James E. Breisch
Life of this patent
Estimating the term…
Abstract
A circuit includes a capacitor formed with a dielectric including the dielectric encasing elements of the circuit. A detector detects changes in the capacitance of the capacitor.
Claims7
A circuit comprising:
- a first capacitor formed with a dielectric including the dielectric encasing elements of the circuit;
- a detector to detect changes in the capacitance of the capacitor, wherein the capacitance changes due to removal of dielectric material;
- approximately parallel conductors located proximate to circuit elements to protect from tampering;
- and
- a comparator to compare a reference voltage with a voltage at a node of the first capacitor, wherein the reference voltage is a voltage at a node of a second capacitor.
2 more elements
A circuit comprising:
- a detector comprising a first capacitor formed from conductive elements arranged such that removal of dielectric material from the vicinity of the conductive elements results in assertion of a signal disabling one or more operations of the circuit, the conductive elements arranged approximately parallel and proximate to elements of the circuit to protect from tampering;
- and
- a comparator to compare a reference voltage with a voltage at a node of the first capacitor, wherein the reference voltage is a voltage at a node of a second capacitor.
A method comprising:
- disabling one or more operations of a circuit upon detecting a change in a capacitance resulting from removal of dielectric material from the vicinity of conductive elements of the circuit, the change in capacitance resulting from removal of dielectric material from the vicinity of approximately parallel conductors located proximate to circuit elements to protect from tampering;
- forming a first capacitor using approximately parallel conductors located proximate to circuit elements to protect from tampering;
- and
- comparing a reference voltage with a voltage at a node of the first capacitor, wherein the reference voltage is a voltage at a node of a second capacitor.
1 more element
A computer system comprising:
- a processor coupled to a memory by way of a bus;
- the processor comprising a detector, the detector comprising a first capacitor formed from conductive elements arranged such that removal of dielectric material from the vicinity of the conductive elements results in assertion of a signal disabling one or more operations of the circuit, the conductive elements arranged approximately parallel and proximate to elements of the processor to protect from tampering;
- and a comparator to compare a reference voltage with a voltage at a node of the capacitor, wherein the reference voltage is a voltage at a node of a second capacitor.
Dependencies are inferred from the claim text.