Atomic force microscope and method for determining properties of a sample surface using an atomic force microscope
AssigneeInternational Business Machines Corporation
InventorDaniel Worledge
Life of this patent
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Abstract
A method for determining properties of a sample surface using an atomic force microscope includes applying a first voltage between the sample and a probe, moving the probe towards the surface of the sample, and stopping movement of the probe towards the surface of the sample when current in the probe is initially detected. An oscillating magnetic field is applied to the probe such that the probe obtains stable contact with the surface of the sample.
Claims17
A method for determining properties of a sample surface using an atomic force microscope, comprising:
- applying a first voltage between the sample and a probe;
- moving the probe towards the surface of the sample;
- stopping movement of the probe towards the surface of the sample when current in the probe is initially detected;
- and
- applying a magnetic field to the probe such that the probe obtains stable contact with the surface of the sample.
An atomic force microscope that determines characteristics of a surface of a specimen, comprising:
- means for applying a first voltage between a sample and a probe;
- means for moving the probe towards the surface of the sample;
- means for stopping movement of the probe towards the surface of the sample when current in the probe is initially detected;
- and
- means for applying a magnetic field to the probe such that the probe obtains stable contact with the surface of the sample.
Dependencies are inferred from the claim text.