Stress measurement method using X-ray diffraction
AssigneeRigaku Corporation
InventorsRyouichi Yokoyama, Kamihisa Endo
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AssigneeRigaku Corporation
InventorsRyouichi Yokoyama, Kamihisa Endo
Estimating the term…
A stress of a c-axis-oriented specimen of a tetragonal polycrystal is measured using X-ray diffraction under the assumption of a plane stress state. An X-ray optical system is set in the location of φ=0°, 45° or 90°. An X-ray diffracted at a crystal plane (the direction of the normal thereto is the direction of an angle of ψ) with the Miller indices (hkl) is detected. A diffraction angle θ in a strain state is measured in the vicinity of a Bragg's angle θ0 in a non-strain state. Strains ε with respect to a plurality of ψ are calculated from the difference between the measurement values θ and the Bragg's angle θ0. Specific stress calculation formulae are determined with respect to the tetragonal system having the Laue symmetry 4/mmm. The stress is calculated from the slope of the linear line of plotted measurement results.
A stress measurement method using X-ray diffraction, said method comprising:
A stress measurement method using X-ray diffraction, said method comprising:
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