Device and method for reducing lag and blooming in amorphous silicon sensor arrays
AssigneeXerox Corporation
InventorRichard L. Weisfield
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AssigneeXerox Corporation
InventorRichard L. Weisfield
Estimating the term…
A clamping circuit including a clamping diode, a bias line, and a clamp line is incorporated into a pixel circuit of amorphous silicon sensor arrays. The clamp diode in each pixel prevents the voltage across the photodiode from dropping below a specific threshold. By keeping the photodiode under reverse bias even under conditions that may otherwise saturate the pixel, image lag is reduced. In full fill factor amorphous silicon sensor arrays, a clamping circuit includes a clamp TFT, a bias plane, a clamp line, and a drain line. The clamp TFT reduces lag and blooming by draining off excess current developed under overexposure conditions. A method to globally reset a sensor array and a method to test and repair a TFT matrix in full fill factor sensor arrays without damaging the overlying collection electrode and sensor layer are also provided.
An image array having a plurality of pixels disposed in rows and columns, wherein each pixel includes a photodiode, a thin film transistor (TFT), and a clamping diode, the image array further comprising:
A clamping circuit in a sensor array that reduces lag comprising:
Dependencies are inferred from the claim text.