Direct power-to-ground ESD protection with an electrostatic common-discharge line
AssigneePericom Semiconductor Corp.
InventorsPaul C. F. Tong, Siu-Weng Simon Wong, Ping Ping Xu, Zhi Qing Liu, Wensong Chen
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AssigneePericom Semiconductor Corp.
InventorsPaul C. F. Tong, Siu-Weng Simon Wong, Ping Ping Xu, Zhi Qing Liu, Wensong Chen
Estimating the term…
ESD protection is provided by local ESD-protection devices between each pad and a common-discharge line (CDL). Each ESD-protection device has p-well or p-substrate taps to a local ground rather than to the CDL, reducing noise coupling from the I/O's through the CDL. Another ESD clamp that bypasses the CDL is provided between each pair of internal power and ground buses. Better protection of core circuits during power-to-ground ESD events is provided by bypassing the CDL since only one ESD clamp rather than two ESD-protection devices must turn on. The ESD clamps and ESD-protection devices can be gate-coupled n-channel transistors with coupling capacitors between the pad and the transistor gate. Devices can also be substrate-triggered transistors or active ESD clamps that include an inverter between a coupling capacitor to the CDL and the n-channel transistor gate.
An electro-static-discharge (ESD) protected integrated circuit comprising:
An electro-static-discharge (ESD) protection circuit comprising:
An integrated circuit comprising:
Dependencies are inferred from the claim text.