Lead formation, assembly strip test, and singulation system

A system for testing integrated circuits formed on an assembly strip, the assembly strip including a leadframe defining a plane and a plurality of integrated circuits mounted on the leadframe, each integrated circuit being electrically coupled to a plurality of leads extending between the integrated circuit and the leadframe, the system comprising:

• a lead length cut/form apparatus for cutting and forming the leads such that the leads are bent away from the plane defined by the assembly strip,
• a functional test apparatus including a plurality of probes arranged to contact the cut and formed leads of the integrated circuit;
• a base;
• and
• a drive apparatus including a cam mechanism mounted over the base and a motor for reciprocating the cam mechanism relative to the base,
• wherein the lead length cut/form apparatus includes a first portion mounted on the base, and a second portion contacting the cam mechanism of the drive apparatus such that the second portion is reciprocated toward and away from the first portion of the lead length cut/form apparatus when the cam mechanism is turned by the motor, and
• wherein the functional test apparatus includes a first portion mounted on the base, and a second portion movably mounted over the first portion of the functional test apparatus.

A system for testing integrated circuits formed on an assembly strip, the assembly strip including a lead frame defining a plane and a plurality of integrated circuits connected to the lead frame, each integrated circuit including a package body housing an integrated circuit chip that is electrically coupled to a plurality of leads extending from the package body, the system comprising:

• means for forming the leads such that portions of the leads are bent out of the plane defined by the lead frame;
• and
• a functional test apparatus including:
• an anvil supporting the integrated circuits, the anvil including a trough for receiving a package body of the integrated circuit, and a pair of rails for supporting the leads such that the bent portions of the leads extend over the rails;
• and
• a probe assembly including a plurality of probes arranged to contact the bent portions of the leads when the probe assembly is moved toward the anvil.