Tip calibration standard and method for tip calibration
AssigneeThe Trustees of the University of Pennsylvania
InventorsDawn Bonnell, Alan T. Johnson, Sergei V. Kalinin, Marcus Freitag
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Abstract
The present invention is directed to a tip calibration standard for characterizing the geometric and electrostatic properties of the probe tips of scanning probe microscopes comprising a carbon nanotube mounted on a dielectric surface of a grounded, conductive substrate and connected to a contact mounted on the substrate. The present invention is also directed to methods for using such a tip calibration standard in calibrating probe tips, computing tip geometry and electrostatic data, and determining the convolution function so that tip-surface interaction effects can be separated from scanning probe microscope surface image data.
Claims20
A tip calibration standard for calibrating scanning probe microscope probe tips comprising a carbon nanotube having a length of at least about 1 micron and a diameter of not greater than about 10 nm, disposed on a dielectric surface of a grounded, conductive substrate and in connection with a contact mounted on the substrate.
Dependencies are inferred from the claim text.