Semiconductor characterization and production information system
AssigneeSiverion, Inc.
InventorsWilliam Miller, Shehanshu Shah, Thomas Martis
Life of this patent
Estimating the term…
Abstract
A system in accordance with the present invention provides characterization information for semiconductor products. The system includes a plurality of data sources, each providing data pertaining to the products. A server is coupleable to each data source. A database is coupled to the server for storing data from the data sources. An automatic data collection engine at the server automatically collects data from the sources. A characterization engine resident at the server operates on the data to provide characterization information. A reporting application engine operable at the server generates characterization reports from the characterization information. The characterization reports are selectable.
Claims21
A system for providing characterization information for semiconductor products, comprising:
- a plurality of data sources, each of said data sources providing data pertaining to said products;
- a server coupleable to each of said plurality of data sources;
- a database coupled to said server for storing data from said data sources;
- an automatic data collection engine at said server for automatically collecting data from said sources;
- a characterization engine resident at said server for operating on said data to provide characterization information;
- a reporting application engine operable at said server for generating characterization reports from said characterization information;
- said characterization reports being selectable.
Dependencies are inferred from the claim text.