Method for forming a damascene structure
AssigneeSilicon Integrated Systems Corp.
InventorsTzu-Kun Ku, Chia-Yang Wu
Life of this patent
Estimating the term…
Loading patent…
AssigneeSilicon Integrated Systems Corp.
InventorsTzu-Kun Ku, Chia-Yang Wu
Estimating the term…
A method for forming a damascene structure. An insulating layer is deposited on a substrate. A capping layer and a hard mask layer are successively formed on the insulating layer. Subsequently, the hard mask layer is etched to form at least one opening using the capping layer as an etching stop layer. A conformable metal layer is formed over the hard mask layer and the surface of the opening, and the metal layer is then anisotropically etched to form a metal spacer over the sidewall of the opening. Next, the capping layer and the underlying insulating layer under the opening are etched to form a trench therein. Next, the hard mask layer and the metal spacer are removed. Finally, the trench is filled with the conductive layer to complete the damascene structure after the substrate is cleaned.
A method for forming a damascene structure, comprising the steps of:
Dependencies are inferred from the claim text.