Scanning exposure method with reduced time between scans
AssigneeNikon Corporation
InventorsAndrew J. Hazelton, Bausan Yuan
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AssigneeNikon Corporation
InventorsAndrew J. Hazelton, Bausan Yuan
Estimating the term…
A positioning method in which a system performs operations relative to areas on a substrate by a series of relative movements between the system and substrate scanning exposures. The method includes the steps of disposing a first area relative to a system performing an operation relative to the first area, and moving the substrate from a first position where the first operation relative to the first area has finished to a second position where a second operation relative to a second area is to start, and synchronously moving the system from a third position where the first operation relative to the first area has finished to a fourth position where the second operation relative to the second area is to start. An acceleration of the substrate during movement from the first position to the second position and an acceleration of the system during movement from the third position to the fourth position continually have absolute values greater than zero.
A step-and-scan exposure method comprising the steps of:
A step-and-scan exposure method in which patterns on a mask are transferred to shot areas on a photosensitive substrate by a series of scanning exposures, the method comprising the steps of:
A step-and-scan exposure method in which patterns on a mask are transferred to shot areas on a photosensitive substrate by a series of scanning exposures, the method comprising the steps of:
A method of moving a substrate comprising the steps of:
A method of moving a system above a substrate in which operations are performed relative to areas of the substrate, comprising the steps of:
A method of moving a system and a substrate to perform a series of operations, the method comprising the steps of:
Dependencies are inferred from the claim text.