Optical characteristic measuring apparatus, the method thereof and recording medium
AssigneeAdvantest Corporation
InventorsEiji Kimura, Motoki Imamura, Fumio Inui
Life of this patent
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AssigneeAdvantest Corporation
InventorsEiji Kimura, Motoki Imamura, Fumio Inui
Estimating the term…
An apparatus capable of reducing a waveform distortion of outgoing light when light of an optical wavelength in a certain specific narrow range is incident upon optical fiber comprises optical source 10 for supplying the incident light to optical fiber line 110, waveform monitor 42 for measuring a waveform distortion of the transmitted light and adjusting unit 44 for adjusting an output of the incident light so that the measured waveform distortion falls within a predetermined range. By adjusting the output of the incident light, a S/N ration is lowered. Since the noise exists within a relatively wide range of wavelength, the rang of wavelength of the incident light is widened. Therefore, it is possible to reduce the waveform distortion of the outgoing light.
An optical characteristic measuring apparatus for measuring a characteristic of a light transmitting objective, said apparatus comprising:
An optical characteristic measuring method for measuring a characteristic of a light transmitting objective, said method comprising the steps of:
A computer-readable medium having a program of instructions for execution by a computer to perform an optical characteristic measuring process for measuring a characteristic of a light transmitting objective, said optical characteristic measuring process comprising:
Dependencies are inferred from the claim text.