Vapor drying for cleaning photoresists
AssigneeAdvanced Micro Devices, Inc.
InventorsMichael K. Templeton, Ramkumar Subramanian, Khoi A. Phan, Bharath Rangarajan
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AssigneeAdvanced Micro Devices, Inc.
InventorsMichael K. Templeton, Ramkumar Subramanian, Khoi A. Phan, Bharath Rangarajan
Estimating the term…
One aspect of the present invention relates to a method of cleaning a patterned photoresist clad structure involving the steps of contacting the patterned photoresist clad structure with an alcohol vapor comprising at least one compound having the Formula ROH, wherein R is a hydrocarbon group comprising from 4 to about 8 carbon atoms; condensing the alcohol vapor on the patterned photoresist clad structure; and removing the condensed alcohol vapor from the patterned photoresist clad structure. Another aspect of the present invention involves the use of an alcohol vapor having a boiling point from about 102° C. to about 175° C. Yet another aspect of the present invention involves the use of an alcohol vapor having a flash point from about 15° C. to about 80° C.
A method of cleaning a patterned photoresist clad structure comprising
A method of cleaning a patterned photoresist clad structure comprising
A method of cleaning a patterned photoresist clad structure comprising
Dependencies are inferred from the claim text.