Method for fabricating a scanning probe microscope probe
AssigneeInternational Business Machines Corporation
InventorsMahadevaiyer Krishnan, Mark E. Lagus, Kevin S. Petrarca, James G. Ryan, Richard P. Volant
Life of this patent
Estimating the term…
Loading patent…
AssigneeInternational Business Machines Corporation
InventorsMahadevaiyer Krishnan, Mark E. Lagus, Kevin S. Petrarca, James G. Ryan, Richard P. Volant
Estimating the term…
A scanning probe microscope probe is formed by depositing probe material in a mold that has a cavity in a shape and of a size of the desired form of the scanning probe microscope probe that is being fabricated. In the preferred embodiment, the cavity is formed by lithographically defining, in the body of the mold, the shape and the size of the desired scanning probe microscope probe and etching the body of the mold to form the cavity. Prior to depositing the probe material in the cavity in the mold, the cavity is lined with a release layer which, upon activation after the probe has been formed, permits removal of the probe.
A method for fabricating a scanning probe microscope probe comprising the steps of:
Dependencies are inferred from the claim text.