Method and system for synchronizing lead scanners and laser marker modules

A system for synchronizing a laser marking device with a lead scanner, the laser marking device including an unloader coupled to the lead scanner, the laser marking device for marking each of a plurality of semiconductor packages including a plurality of leads, the lead scanner for performing a test of the plurality of leads for the plurality of semiconductor packages, the unloader for containing a portion of the plurality of semiconductor packages, the portion of the plurality of semiconductor packages having passed the test, the system comprising:

• an input receiving circuit, coupled with the unloader, for receiving an indication of a particular number of the plurality of semiconductor packages received by the unloader;
• a reset circuit, coupled with the lead scanner and the input receiving circuit, capable of generating at least one reset signal for resetting the lead scanner in response to the particular number of the plurality of semiconductor packages being reached;
• and
• an output relay, coupled with the lead scanner and the reset circuit, for temporarily precluding the lead scanner from providing a semiconductor package to the unloader;
• wherein the lead scanner includes a transfer mechanism for transferring the plurality of packages to the unloader and a plurality of switches for controlling the transfer mechanism, and wherein the output relay controls the plurality of switches to ensure that the transfer mechanisms provides no semiconductor package to the unloader for a particular time.

A system for synchronizing a laser marking device with a lead scanner, the laser marking device including an unloader coupled to the lead scanner, the laser marking device for marking each of a plurality of semiconductor packages including a plurality of leads, the lead scanner for performing a test of the plurality of leads for the plurality of semiconductor packages, the unloader for containing a portion of the plurality of semiconductor packages, the portion of the plurality of semiconductor packages having passed the test, the system comprising:

• an input receiving circuit, coupled with the unloader, for receiving an indication of a particular number of the plurality of semiconductor packages received by the unloader;
• a reset circuit, coupled with the lead scanner and the input receiving circuit, capable of generating at least one reset signal for resetting the lead scanner in response to the particular number of the plurality of semiconductor packages being reached;
• and
• an output relay, coupled with the lead scanner and the reset circuit, for temporarily precluding the lead scanner from providing a semiconductor package to the unloader;
• wherein the particular number is the particular number of good semiconductor packages of the plurality of semiconductor packages and wherein the unloader releases the plurality of good semiconductor packages when the particular number is reached.