Method of manufacturing a dual gate semiconductor device with a poly-metal electrode
AssigneeHitachi, Ltd.
InventorNaoki Yamamoto
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Abstract
In order to realize a dual gate CMOS semiconductor device with little leakage of boron that makes it possible to divisionally doping a p-type impurity and an n-type impurity into a polycrystalline silicon layer with one mask, a gate electrode has a high melting point metal/metallic nitride barrier/polycrystalline silicon structure. The boron is pre-doped in the polycrystalline silicon layer. The phosphorus or arsenic is doped in an n-channel area. Then, the annealing in a hydrogen atmosphere with vapor added therein is performed. As a result, the boron is segregated on the interface of the metallic nitride film and the phosphorus is segregated on the interface of the gate oxide film, for forming an n+ gate.
Claims6
A method of manufacturing a semiconductor device having an NMOS transistor and a PMOS transistor, comprising:
- forming a gate insulating film on a semiconductor substrate;
- forming a semiconductor film on said gate insulating film;
- forming a mask for covering an area where said PMOS transistor is to be formed and introducing an n-type impurity into an area where said NMOS transistor is to be formed to said semiconductor film;
- removing said mask and introducing a p-type impurity into the corresponding portion of said semiconductor film to an area where said NMOS transistor is to be formed and the corresponding portion of said semiconductor film to an area where said PMOS transistor is to be formed;
- forming a metal nitride film on said semiconductor film, said metal nitride film covering both said PMOS area and said NMOS area;
- working a stacked film containing said semiconductor film and said metal nitride film for forming gate electrodes of said NMOS transistor and said PMOS transistor;
- and
- performing an annealing to make said p-type impurity to be segregated at an interface of said metal nitride film and said n-type impurity to be segregated at an interface of said gate insulating film.
Dependencies are inferred from the claim text.