Exposure apparatus, exposure method, and device manufacturing method
AssigneeNikon Corporation
InventorYutaka Hayashi
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AssigneeNikon Corporation
InventorYutaka Hayashi
Estimating the term…
The exposure apparatus comprises a gas supply system that supplies a low absorptive gas with a predetermined purity to the illumination system housing and the barrel of the projection optical system and collects the gas exhausted from these closed spaces and supplies the gas to the mask chamber which houses the mask stage and the substrate chamber which houses the substrate stage. The illumination system housing, the barrel of the projection optical system, the mask chamber, and the substrate chamber are respectively located on the optical path of the exposure light. Accordingly, the low absorptive gas that has circulated the illumination system housing and the barrel of the projection optical system is used as the replacement gas of the mask chamber and the substrate chamber, while sufficiently satisfying the purity of the low absorptive gas and maintaining the transmittance of the exposure light required in each chamber. Thus, the usage efficiency of the low absorptive gas can be improved, and wasteful consumption of the low absorptive gas can be suppressed.
An exposure apparatus that illuminates a mask with an energy beam from an energy beam source and transfers a pattern formed on said mask onto a substrate, said exposure apparatus comprising:
An exposure method to illuminate a mask with an energy beam from an energy beam source and transfer a pattern formed on said mask onto a substrate, said exposure method comprising:
Dependencies are inferred from the claim text.