Exposure apparatus and device manufacturing method
AssigneeCanon Kabushiki Kaisha
InventorsHiroyuki Koide, Kazuhito Outsuka
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AssigneeCanon Kabushiki Kaisha
InventorsHiroyuki Koide, Kazuhito Outsuka
Estimating the term…
An exposure apparatus has an illumination system for transferring a reticle pattern formed on a reticle as a master onto a wafer as a photosensitive member by a laser source, a stop for setting an illumination region by the laser source, and a mechanism for synchronously scanning the reticle and wafer in predetermined scanning directions. Exposure processing by synchronous scanning of the reticle and wafer and relative movement of the wafer in a direction crossing the scanning direction are repeated, thereby forming a transfer pattern with connected exposure regions on the wafer. The stop driving mechanism performs exposure while driving a vane of the stop for setting the illumination region in the direction perpendicular to the scanning direction in the direction crossing the scanning direction during the exposure processing.
An exposure apparatus having an illumination system for transferring a pattern formed on a master onto a photosensitive member by exposure light and a stop for setting an illumination region on the photosensitive member by the exposure light, said apparatus comprising:
An exposure method for an exposure apparatus having an illumination system for transferring a pattern formed on a master onto a photosensitive member by exposure light and a stop for setting an illumination region on the photosensitive member by the exposure light, said method comprising:
A device manufacturing method of manufacturing a semiconductor device, said method comprising:
Dependencies are inferred from the claim text.