Quality control method for product production apparatus
AssigneeMitsubishi Denki Kabushiki
InventorNaoko Takanabe
Life of this patent
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Abstract
A method and system for quality control of a production line. Troubles with quality are prevented by detecting a trend in quality characteristics of the production line or fluctuations in an early stage. The absolute values of the differences between same kinds of the data obtained at given measurement points regarding quality control data or the absolute values of the differences between same items of one kind of SPC data are used as a controlled item for detecting a trend in quality control characteristics or fluctuations of the quality control characteristics. The differences between maximum and minimum values of the quality control data at measurement points within the same lot or within the same wafer are used as the differences between same kinds of the quality control data, for example.
Claims3
A quality control method for a production line including at least one fabricating step for fabricating products including plural groups of a series of lots, said quality control method comprising:
- inspecting products being fabrication in association with results of fabrication steps and collecting inspection data from the inspecting;
- storing the inspection data obtained in a memory;
- statistically processing the inspection data stored in the memory to derive statistical data;
- and
- managing variations in the statistical data to manage quality characteristics of the products being fabricated, wherein a trend in quality is managed using absolute values of differences between the statistical data derived from the two groups of the series of lots processed in succession.
Dependencies are inferred from the claim text.