Semiconductor device

A semiconductor device comprising:

• an active layer of a first conductive type;
• a base layer of a second conductive type selectively formed on a first surface region of said active layer;
• a source layer of the first conductive type selectively formed on a surface region of said base layer;
• an anode layer of the second conductive type selectively formed on a second surface region of the active layer, said anode layer being spaced from said base layer;
• a drain layer of the first conductive type formed on a third surface region of the active layer between said base layer and said anode layer;
• a resistive layer of the first conductive type formed on a fourth surface region of the active layer between said base layer and said drain layer;
• and
• a gate electrode formed above a region of said base layer between said source layer and said active layer, a gate insulating film being disposed between said base layer and said gate electrode, wherein
• a source electrode is formed on a surface of the base layer and a surface of the source layer, and a drain electrode is formed on a surface of the drain layer and a surface of the anode layer;
• and
• a junction depth of said anode layer is greater than a junction depth of said drain layer.