Mass analysis apparatus and method for mass analysis
AssigneeHitachi, Ltd.
InventorYoshiaki Kato
Life of this patent
Estimating the term…
Loading patent…
AssigneeHitachi, Ltd.
InventorYoshiaki Kato
Estimating the term…
A mass analysis apparatus is capable of performing a plurality of measurements in parallel by mounting a plurality of ion sources onto one mass spectrometer and speedily switching the ion sources. In a mass analysis apparatus for performing mass analysis by introducing ions produced in an ion source into a mass spectrometer, the mass analysis apparatus comprises a plurality of ion sources; and a deflecting means for deflecting ions from at least one ion source among the plurality of ion sources so that the ions travel toward the mass spectrometer by producing an electric field.
A mass analysis apparatus comprising a plurality of ion sources for ionizing a sample to be analyzed;
A mass analysis apparatus comprising a first chamber containing an ion source producing ions of a sample to be analyzed;
Dependencies are inferred from the claim text.
Drawings are temporarily unavailable. Open the PDF at USPTO
From the US filing history. Foreign family members aren’t listed.
Ion sources; Ion guns: arrangements for using several ion sources
Details: arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or…
Electron- or ion-optical arrangements: ion deflecting means, e.g. ion gates
Electric discharge tubes or discharge lamps
Term ended 14 Apr 2020 (estimated)
1. Field of the Invention
The present invention relates to a mass analysis apparatus and, more particularly to a mass analysis apparatus suitable for improving measuring efficiency and for increasing volume of information obtainable per unit time.
2. Description of the Prior Art
FIG. 1 is a block diagram showing the basic configuration of a first embodiment of an atmospheric pressure ionization LC/MS in accordance with the present invention.
FIG. 2 is a view explaining an electrostatic deflector.
FIG. 3 is a view showing an outward appearance of the first embodiment in accordance with the present invention.
(First Embodiment)
FIG. 1 is a block diagram showing the basic configuration of a first embodiment of an atmospheric pressure ionization LC/MS apparatus in accordance with the present invention.
As shown in FIG. 1, in the atmospheric pressure ionization LC/MS apparatus, two liquid chromatographs (hereinafter, referred to as LC) are connected to one mass spectrometer (hereinafter, referred to as MS) individually through atmospheric pressure ion sources.